CRC Press
MOS Interface Physics, Process and Characterization
Product Code:
9781032106281
ISBN13:
9781032106281
Condition:
New
$67.93
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
| Author: Shengkai Wang, Xiaolei Wang |
| Publisher: CRC Press |
| Publication Date: Jan 29, 2024 |
| Number of Pages: NA pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 103210628X |
| ISBN-13: 9781032106281 |
MOS Interface Physics, Process and Characterization
$67.93
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
| Author: Shengkai Wang, Xiaolei Wang |
| Publisher: CRC Press |
| Publication Date: Jan 29, 2024 |
| Number of Pages: NA pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 103210628X |
| ISBN-13: 9781032106281 |
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