As the complexity and miniaturization of electronic hardware advances, more time and money is actually now spent on testing and verification than in the preliminary design stage. This practical-oriented guidebook covers both the fundamentals and the techniques of constraint-based testbench automation. The book compares and contrasts constraint-based verification with traditional testbench approaches: test generation (a key concept), simulation monitoring, and coverage. Related aspects of verification languages such as e/vera/PSL/OVL/SVA are also covered. On the technical side, state-of-the art algorithms of test generation, performance optimization, and randomization are explained.
| Author: Jun Yuan |
| Publisher: Springer |
| Publication Date: Oct 29, 2010 |
| Number of Pages: 254 pages |
| Binding: Paperback or Softback |
| ISBN-10: 1441938524 |
| ISBN-13: 9781441938527 |