Skip to main content

Springer

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

No reviews yet
Product Code: 9781441965677
ISBN13: 9781441965677
Condition: New
$232.16

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

$232.16
 

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.




Author: Sergei V. Kalinin
Publisher: Springer
Publication Date: Dec 10, 2010
Number of Pages: 555 pages
Binding: Hardback or Cased Book
ISBN-10: 144196567X
ISBN-13: 9781441965677
 

Customer Reviews

This product hasn't received any reviews yet. Be the first to review this product!

Faster Shipping

Delivery in 3-8 days

Easy Returns

14 days returns

Discount upto 30%

Monthly discount on books

Outstanding Customer Service

Support 24 hours a day