Springer
Bias Temperature Instability for Devices and Circuits
Product Code:
9781461479086
ISBN13:
9781461479086
Condition:
New
$180.44
Bias Temperature Instability for Devices and Circuits
$180.44
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
| Author: Tibor Grasser |
| Publisher: Springer |
| Publication Date: Oct 23, 2013 |
| Number of Pages: 810 pages |
| Binding: Hardback or Cased Book |
| ISBN-10: 1461479088 |
| ISBN-13: 9781461479086 |
Related Products
Sale 11%
