Skip to main content

Springer

Physical Measurement and Analysis of Thin Films

No reviews yet
Product Code: 9781489959126
ISBN13: 9781489959126
Condition: New
$61.47

Physical Measurement and Analysis of Thin Films

$61.47
 
Physical Measurement and Analysis of Thin Films


Author: E. M. Murt
Publisher: Springer
Publication Date: Dec 07, 2013
Number of Pages: 194 pages
Binding: Paperback or Softback
ISBN-10: 1489959122
ISBN-13: 9781489959126
 

Customer Reviews

This product hasn't received any reviews yet. Be the first to review this product!

Faster Shipping

Delivery in 3-8 days

Easy Returns

14 days returns

Discount upto 30%

Monthly discount on books

Outstanding Customer Service

Support 24 hours a day