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Uncertainty Analysis For NIST Noise-Parameter Measurement
Product Code:
9781494743970
ISBN13:
9781494743970
Condition:
New
$18.37
Uncertainty Analysis For NIST Noise-Parameter Measurement
$18.37
Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
| Author: U. S. Department of Commerce |
| Publisher: Createspace Independent Publishing Platform |
| Publication Date: Jan 21, 2014 |
| Number of Pages: 36 pages |
| Binding: Paperback or Softback |
| ISBN-10: 1494743973 |
| ISBN-13: 9781494743970 |
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