ELFT Phase II - An Evaluation of Automated Latent Fingerprint Identification Technologies

The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatic feature extraction and matching (AFEM). This test is Phase II of the Evaluation of Latent Fingerprint Technology (ELFT) project. The test was open to both the commercial and academic community, and participants included vendors of Automated Fingerprint Identification Systems (AFIS). This report provides the design, process, caveats, results, observations and conclusions of the test.

Author: U. S. Department of Commerce

Publisher: Createspace Independent Publishing Platform

Publication Date: Apr 28, 2014

Number of Pages: 108 pages

Binding: Paperback or Softback

ISBN-10: 1499211678

ISBN-13: 9781499211672