Momentum Press
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
Product Code:
9781606505885
ISBN13:
9781606505885
Condition:
New
$79.95
$69.84
Sale 13%
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
$79.95
$69.84
Sale 13%
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
| Author: Fred Stevie |
| Publisher: Momentum Press |
| Publication Date: Sep 15, 2015 |
| Number of Pages: 277 pages |
| Binding: Paperback or Softback |
| ISBN-10: 1606505882 |
| ISBN-13: 9781606505885 |
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