Encyclopedia of Scanning Electron Microscopy

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.

Author: Lisa Page

Publisher: NY Research Press

Publication Date: Jan 30, 2015

Number of Pages: 324 pages

Binding: Hardback or Cased Book

ISBN-10: 1632381664

ISBN-13: 9781632381668