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Imperial College Press

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis

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Product Code: 9781848167896
ISBN13: 9781848167896
Condition: New
$235.28

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis

$235.28
 
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.


Author: Nobuo Tanaka
Publisher: Imperial College Press
Publication Date: Jun 06, 2014
Number of Pages: 616 pages
Binding: Hardback or Cased Book
ISBN-10: 184816789X
ISBN-13: 9781848167896
 

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