Springer
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Product Code:
9783319005898
ISBN13:
9783319005898
Condition:
New
$118.37
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
$118.37
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
| Author: Kipp Van Schooten |
| Publisher: Springer |
| Publication Date: Jul 30, 2013 |
| Number of Pages: 90 pages |
| Binding: Hardback or Cased Book |
| ISBN-10: 3319005898 |
| ISBN-13: 9783319005898 |
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