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Defect Sizing Using Non-Destructive Ultrasonic Testing: Applying Bandwidth-Dependent Dac and Dgs Curves

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Product Code: 9783319328348
ISBN13: 9783319328348
Condition: New
$128.71

Defect Sizing Using Non-Destructive Ultrasonic Testing: Applying Bandwidth-Dependent Dac and Dgs Curves

$128.71
 
This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.


Author: Wolf Kleinert
Publisher: Springer
Publication Date: May 13, 2016
Number of Pages: 118 pages
Binding: Hardback or Cased Book
ISBN-10: 3319328344
ISBN-13: 9783319328348
 

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