World Scientific Publishing Company
Theory and Methods of Photovoltaic Material Characterization
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Springer
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
Product Code:
9783540253037
ISBN13:
9783540253037
Condition:
New
$345.95
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
$345.95
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
| Author: Stefan Rein |
| Publisher: Springer |
| Publication Date: Jun 23, 2005 |
| Number of Pages: 492 pages |
| Binding: Hardback or Cased Book |
| ISBN-10: 3540253033 |
| ISBN-13: 9783540253037 |
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