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Springer
Nanoscale Spectroscopy and Its Applications to Semiconductor Research
Product Code:
9783540433125
ISBN13:
9783540433125
Condition:
New
$118.37
Nanoscale Spectroscopy and Its Applications to Semiconductor Research
$118.37
Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
| Author: Y. Watanabe |
| Publisher: Springer |
| Publication Date: Jul 19, 2002 |
| Number of Pages: 308 pages |
| Binding: Hardback or Cased Book |
| ISBN-10: 3540433120 |
| ISBN-13: 9783540433125 |
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