Springer
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
Product Code:
9783540434436
ISBN13:
9783540434436
Condition:
New
$232.16
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
$232.16
A new materials characterization methods, anomalous X-ray scattering, is presented in this book.
| Author: Yoshio Waseda |
| Publisher: Springer |
| Publication Date: Sep 11, 2002 |
| Number of Pages: 214 pages |
| Binding: Hardback or Cased Book |
| ISBN-10: 3540434437 |
| ISBN-13: 9783540434436 |
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