VDM Verlag Dr. Mueller E.K.
Growth and Characterization of Al(1-x)In(x)N Films and Nanostructures - Nitrides, Epitaxy, Selfassembly and Optoelectronics
Product Code:
9783639030280
ISBN13:
9783639030280
Condition:
New
$63.72
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Growth and Characterization of Al(1-x)In(x)N Films and Nanostructures - Nitrides, Epitaxy, Selfassembly and Optoelectronics
$63.72
$63.18
Sale 1%
The book contains experimental information of pseudo-epitaxial growth a series of Al(1-x)In(x)N films with thicknesses ranging from 100 nm to 8000 nm and In concentration (x) ranging from 0 to 1 on different substrates (Si, Sapphire, SiC glass) using Plasma Source Molecular Beam Epitaxy (PSMBE) techniques. Using different growth modes as the specific film morphology, the self-assembled nanostructures were created. The mechanism of carrier confinement in these structures are described. Theoretically and experimentally shown that the electron localization may exist in the nanostructures by piezoelectric field from AlN buffer layer. Optical investigation of the fundamental bandgap Eg of InxAl1-xN in the temperature range 70-700K and compositional range (0
| Author: Yuriy Danylyuk |
| Publisher: VDM Verlag Dr. Mueller E.K. |
| Publication Date: Sep 10, 2008 |
| Number of Pages: 124 pages |
| Binding: Paperback or Softback |
| ISBN-10: 3639030281 |
| ISBN-13: 9783639030280 |
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