Springer
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
Product Code:
9783642083723
ISBN13:
9783642083723
Condition:
New
$344.93
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
$344.93
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| Author: P. W. Hawkes |
| Publisher: Springer |
| Publication Date: Dec 01, 2010 |
| Number of Pages: 529 pages |
| Binding: Paperback or Softback |
| ISBN-10: 3642083722 |
| ISBN-13: 9783642083723 |
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