The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin- ciple, reflect three-dimensional information about the structure of the dif- fracting material. Recent progress in understanding this diffraction phenome- non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys- tematic review of this type of diffraction, encompasses its diverse applica- tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.
| Author: Shih-Lin In-Hang |
| Publisher: Springer |
| Publication Date: Dec 22, 2011 |
| Number of Pages: 300 pages |
| Binding: Paperback or Softback |
| ISBN-10: 3642821685 |
| ISBN-13: 9783642821684 |
