Springer
Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering
Product Code:
9783662149751
ISBN13:
9783662149751
Condition:
New
$61.47
Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering
$61.47
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
| Author: Helmut Dosch |
| Publisher: Springer |
| Publication Date: Oct 03, 2013 |
| Number of Pages: 149 pages |
| Binding: Paperback or Softback |
| ISBN-10: 3662149753 |
| ISBN-13: 9783662149751 |
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