Springer
Design, Analysis and Test of Logic Circuits Under Uncertainty
Product Code:
9789400797987
ISBN13:
9789400797987
Condition:
New
$117.02
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
| Author: Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
| Publisher: Springer |
| Publication Date: Oct 15, 2014 |
| Number of Pages: NA pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 9400797982 |
| ISBN-13: 9789400797987 |
Design, Analysis and Test of Logic Circuits Under Uncertainty
$117.02
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
| Author: Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
| Publisher: Springer |
| Publication Date: Oct 15, 2014 |
| Number of Pages: NA pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 9400797982 |
| ISBN-13: 9789400797987 |
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