Intechopen
Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
Product Code:
9789535104148
ISBN13:
9789535104148
Condition:
New
$155.00
$138.21
Sale 11%
Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
$155.00
$138.21
Sale 11%
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
| Author: Victor Bellitto |
| Publisher: Intechopen |
| Publication Date: 40991 |
| Number of Pages: 272 pages |
| Binding: Science |
| ISBN-10: 9535104144 |
| ISBN-13: 9789535104148 |
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