Springer
VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers
Product Code:
9789811074691
ISBN13:
9789811074691
Condition:
New
$117.02
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
| Author: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh |
| Publisher: Springer |
| Publication Date: Dec 22, 2017 |
| Number of Pages: 815 pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 9811074690 |
| ISBN-13: 9789811074691 |
VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers
$117.02
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
| Author: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh |
| Publisher: Springer |
| Publication Date: Dec 22, 2017 |
| Number of Pages: 815 pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 9811074690 |
| ISBN-13: 9789811074691 |
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