This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
| Author: Rongming Wang, Chen Wang, Hongzhou Zhang |
| Publisher: Springer Tracts in Modern Phys |
| Publication Date: Jan 11, 2019 |
| Number of Pages: 518 pages |
| Language: English |
| Binding: Paperback |
| ISBN-10: 9811344205 |
| ISBN-13: 9789811344206 |
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