World Scientific Publishing Company
Radiation Effects & Soft Errors ...(V34)
Product Code:
9789812389404
ISBN13:
9789812389404
Condition:
New
$172.17
Radiation Effects & Soft Errors ...(V34)
$172.17
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
| Author: Ronald D. Schrimpf |
| Publisher: World Scientific Publishing Company |
| Publication Date: 38202 |
| Number of Pages: 348 pages |
| Binding: Technology & Engineering |
| ISBN-10: 9812389407 |
| ISBN-13: 9789812389404 |
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