Morgan & Claypool
Introduction to Focused Ion Beam Nanometrology : 9781681740201
Product Code:
9781681740201
ISBN13:
9781681740201
Condition:
New
$107.98
Introduction to Focused Ion Beam Nanometrology : 9781681740201
$107.98
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
| Author: David C. Cox |
| Publisher: Morgan & Claypool |
| Publication Date: Oct 01, 2015 |
| Number of Pages: 104 pages |
| Binding: Paperback or Softback |
| ISBN-10: 1681740206 |
| ISBN-13: 9781681740201 |
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