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SciTech Publishing

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

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Product Code: 9781891121890
ISBN13: 9781891121890
Condition: New
$165.00
$151.17
Sale 8%

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

$165.00
$151.17
Sale 8%
 

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.




Author: Jianjun Gao
Publisher: SciTech Publishing
Publication Date: Jun 30, 2010
Number of Pages: 350 pages
Binding: Hardback or Cased Book
ISBN-10: 1891121898
ISBN-13: 9781891121890
 

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