
This comprehensive volume presents a wealth of practical knowledge in the field of MOS transistor modeling. Coverage includes the 2/3D process and device simulations with a focus on high-voltage MOSFET devices, the development of both PSP and EKV models, and comparisons of physics-based MOSFET models with measurement-based models. The variety of subjects and the high quality content of this volume make it a preferred reference for researchers and users of MOSFET devices and models. The book is recommended for everyone involved in compact model developments, numerical TCAD modeling, parameter extraction, space-level simulation or model standardization.
Author: Wladyslaw Grabinski |
Publisher: Springer |
Publication Date: 40470 |
Number of Pages: 294 pages |
Binding: Technology & Engineering |
ISBN-10: 9048171482 |
ISBN-13: 9789048171484 |