Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Author: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Publisher: Springer

Publication Date: Oct 06, 2017

Number of Pages: 137 pages

Language: English

Binding: Paperback

ISBN-10: 9811044325

ISBN-13: 9789811044328